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Front and back side SIMS analysis of boron-doped delta-layer in diamond

Abstract : Nowadays the availability of very thin diamond layers in the range of nanometers as well as the possibility to characterize such delta-layer structures are required for the field of photonics and spintronics, but also for the development of next generation high power devices involving boron doping. The fabrication of diamond structures with abrupt interfaces such as superlattices and quantum wells has been recently improved. A very accurate characterization is then essential even though the analysis of such structures is arduous and challenging. SIMS analyses are commonly used to obtain depth profiles of dopants. However, below 10 nm in thickness, SIMS induced ion mixing effects which are no longer negligible. Then the raw SIMS profile might differ from the real dopant profile. In this study, we have analyzed a diamond structure containing a thin boron epilayer, especially synthesized to achieve SIMS analysis on both sides and to overcome the effects of ion mixing. We evidence the ion mixing induced by primary ions. Such a structure is a delta diamond layer, comparable to classical boron-doped delta-layer in silicon. Our results show that the growth of boron-doped delta-layer in diamond is now well controlled in terms of thickness and interfaces.
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Submitted on : Thursday, December 10, 2020 - 11:37:19 AM
Last modification on : Thursday, February 17, 2022 - 10:08:05 AM
Long-term archiving on: : Thursday, March 11, 2021 - 7:18:28 PM


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M. A. Pinault-Thaury, F. Jomard, Christine Mer-Calfati, Nicolas Tranchant, Michal Pomorski, et al.. Front and back side SIMS analysis of boron-doped delta-layer in diamond. Applied Surface Science, Elsevier, 2017, 410, pp.464-469. ⟨10.1016/j.apsusc.2017.03.118⟩. ⟨cea-01803833⟩



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