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Conference Papers Year : 2015

Workload-dependent BTI analysis in a processor core at high level

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Abstract

This work presents a software tool that enables joint architecture simulation and estimation of ageing-induced timing drifts at register-transfer level (RTL). The objective is to enable design exploration of processor microarchitecture under ageing constraint. The tool makes the bridge between user application, micro-architecture design, PVT corner and device-level degradation model. The environment will aid design engineers to apply early software and architecture optimizations at RTL for a better power consumption, performance and failure rate tradeoff. © 2015 IEEE.
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Dates and versions

cea-01719961 , version 1 (28-02-2018)

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C.A Sandionigi, E.A Piriou, S.A Mbarek, V.B Huard, O. Heron. Workload-dependent BTI analysis in a processor core at high level. IEEE International Reliability Physics Symposium Proceedings, Apr 2015, Monterrey, United States. pp.CA61--CA66, ⟨10.1109/IRPS.2015.7112784⟩. ⟨cea-01719961⟩
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