Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL - Archive ouverte HAL Access content directly
Journal Articles Journal of Synchrotron Radiation Year : 2018

Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL

Cristian Mocuta
  • Function : Correspondent author
  • PersonId : 1027132

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Stefan Stanescu
Manon Gallard
  • Function : Author
Antoine Barbier
Arkadiusz Dawiec
  • Function : Author
  • PersonId : 912026

Abstract

This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm$^{-1}$ , also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).
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Dates and versions

cea-01693081 , version 1 (25-01-2018)

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Cristian Mocuta, Stefan Stanescu, Manon Gallard, Antoine Barbier, Arkadiusz Dawiec, et al.. Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL. Journal of Synchrotron Radiation, 2018, 25, pp.204-213. ⟨10.1107/S1600577517015703⟩. ⟨cea-01693081⟩
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