 |
Journal articles
Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL
Abstract : This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm$^{-1}$ , also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).
Keywords :
hybrid pixel area detector
X-ray reflectivity
Cited literature [61 references]
https://hal-cea.archives-ouvertes.fr/cea-01693081
Contributor : Dominique Girard Connect in order to contact the contributor
Submitted on : Thursday, January 25, 2018 - 5:15:38 PM
Last modification on : Monday, January 10, 2022 - 10:16:07 AM
Long-term archiving on: : Friday, May 25, 2018 - 4:58:45 AM
Contributor : Dominique Girard Connect in order to contact the contributor
Submitted on : Thursday, January 25, 2018 - 5:15:38 PM
Last modification on : Monday, January 10, 2022 - 10:16:07 AM
Long-term archiving on: : Friday, May 25, 2018 - 4:58:45 AM
File
JSR25(2018)204-213 Fast XRR..p...
Publisher files allowed on an open archive