Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL

Cristian Mocuta 1, * Stefan Stanescu 1 Manon Gallard 1 Antoine Barbier 2 Arkadiusz Dawiec 1 Bouzid Kedjar 3 Nicolas Leclercq 1 Dominique Thiaudière 1
* Auteur correspondant
1 SSOLEIL - Synchrotron SOLEIL
2 LNO - Laboratoire Nano-Magnétisme et Oxydes
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
3 PPRIME - Institut Pprime
Abstract : This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm$^{-1}$ , also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).
Keywords : hybrid pixel area detector X-ray reflectivity
Type de document :
Article dans une revue
Journal of Synchrotron Radiation, International Union of Crystallography, 2018, 25, pp.204-213. 〈10.1107/S1600577517015703〉
Liste complète des métadonnées

Littérature citée [61 références]  Voir  Masquer  Télécharger
https://hal-cea.archives-ouvertes.fr/cea-01693081
Contributeur : Dominique Girard <>
Soumis le : jeudi 25 janvier 2018 - 17:15:38
Dernière modification le : jeudi 14 février 2019 - 11:32:06
Document(s) archivé(s) le : vendredi 25 mai 2018 - 04:58:45

Fichier

JSR25(2018)204-213 Fast XRR..p...
Fichiers éditeurs autorisés sur une archive ouverte

Identifiants

Collections

CEA | UNIV-POITIERS | DSM-IRAMIS | IRAMIS-SPEC | SYNCHROTRON-SOLEIL | UNIV-PARIS-SACLAY | CEA-DRF | CEA-UPSAY

Citation

Cristian Mocuta, Stefan Stanescu, Manon Gallard, Antoine Barbier, Arkadiusz Dawiec, et al.. Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL. Journal of Synchrotron Radiation, International Union of Crystallography, 2018, 25, pp.204-213. 〈10.1107/S1600577517015703〉. 〈cea-01693081〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

470

Téléchargements de fichiers

105

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD