Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL

Cristian Mocuta 1, * Stefan Stanescu 1 Manon Gallard 1 Antoine Barbier 2 Arkadiusz Dawiec 1 Bouzid Kedjar 3 Nicolas Leclercq 1 Dominique Thiaudière 1
* Corresponding author
2 LNO - Laboratoire Nano-Magnétisme et Oxydes
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
Abstract : This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm$^{-1}$ , also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).
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Cristian Mocuta, Stefan Stanescu, Manon Gallard, Antoine Barbier, Arkadiusz Dawiec, et al.. Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL. Journal of Synchrotron Radiation, International Union of Crystallography, 2018, 25, pp.204-213. ⟨10.1107/S1600577517015703⟩. ⟨cea-01693081⟩

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