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In situ break-junction sample holder for transmission electron microscopy

Santhana Eswara Moorthy 1, * Gerald Le Goff 2 Michel Viret 2 Mathieu Kociak 1
* Corresponding author
2 LNO - Laboratoire Nano-Magnétisme et Oxydes
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
Abstract : In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instru-mentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
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Santhana Eswara Moorthy, Gerald Le Goff, Michel Viret, Mathieu Kociak. In situ break-junction sample holder for transmission electron microscopy. European Physical Journal: Applied Physics, EDP Sciences, 2013, 64, pp.31001. ⟨10.1051/epjap/2013130365⟩. ⟨cea-01498654⟩

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