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Journal articles
In situ break-junction sample holder for transmission electron microscopy
Abstract : In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instru-mentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
Cited literature [6 references]
https://hal-cea.archives-ouvertes.fr/cea-01498654
Contributor : Dominique Girard <>
Submitted on : Thursday, March 30, 2017 - 2:03:06 PM
Last modification on : Tuesday, June 22, 2021 - 3:43:07 AM
Contributor : Dominique Girard <>
Submitted on : Thursday, March 30, 2017 - 2:03:06 PM
Last modification on : Tuesday, June 22, 2021 - 3:43:07 AM
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ap130365.pdf
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