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Journal Articles European Physical Journal: Applied Physics Year : 2013

In situ break-junction sample holder for transmission electron microscopy

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Abstract

In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instru-mentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
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Dates and versions

cea-01498654 , version 1 (30-03-2017)

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Santhana K. Eswara Moorthy, Gerald Le Goff, Michel Viret, Mathieu K Kociak. In situ break-junction sample holder for transmission electron microscopy. European Physical Journal: Applied Physics, 2013, 64, pp.31001. ⟨10.1051/epjap/2013130365⟩. ⟨cea-01498654⟩
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