Journal Articles
Review of Scientific Instruments
Year : 2016
Dominique GIRARD : Connect in order to contact the contributor
https://hal-cea.archives-ouvertes.fr/cea-01481549
Submitted on : Thursday, March 2, 2017-4:58:06 PM
Last modification on : Friday, March 24, 2023-2:53:04 PM
Cite
N. Barrett, D. M. Gottlob, C. Mathieu, C. Lubin, J. Passicousset, et al.. Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions. Review of Scientific Instruments, 2016, 87 (5), ⟨10.1063/1.4948597⟩. ⟨cea-01481549⟩
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