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Journal articles
Full field electron spectromicroscopy applied to ferroelectric materials
N. Barrett
1
J. E. Rault
2
L. Wang
3, 4
C. Mathieu
5
A. Locatelli
6
T. O. Mentes
6
A. Niño
7
S. Fusil
8
M. Bibes
8
Alain Barthélémy
9
D. Sando
8
W. Ren
10
S. Prosandeev
11
L. Bellaiche
12, 13
B. Vilquin
14, 15
A. Petraru
I. P. Krug
C. M. Schneider
16
1
LENSIS - Laboratoire d'Etude des NanoStructures et Imagerie de Surface
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
M. Bibes 8
Author IdHAL : manuelbibes arXiv : https://arxiv.org/a/manuel.bibes ORCID : https://orcid.org/0000-0002-6704-3422
Alain Barthélémy 9
Author Employer institution : Photonique Fibre et Sources Cohérentes IdHAL : alain-barthelemy-limoges ORCID : https://orcid.org/0000-0002-8589-3842
D. Sando 8
Author
W. Ren 10
Author
S. Prosandeev 11
Author
L. Bellaiche 12, 13
Author
B. Vilquin 14, 15
Author IdHAL : bertrand-vilquin ORCID : https://orcid.org/0000-0002-7404-0019
A. Petraru
Author
I. P. Krug
Author
C. M. Schneider 16
Author
1
LENSIS - Laboratoire d'Etude des NanoStructures et Imagerie de Surface (CEA Saclay, DSM/IRAMIS, 91191 Gif sur Yvette cedex - France)
- SPEC - UMR3680 - Service de physique de l'état condensé (SPEC - UMR3680 CEA-CNRS
(ex-URA 2464),
CEA/Saclay,
Orme des Merisiers,
F-91191 GIF SUR YVETTE CEDEX - France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DRF/IRAMIS (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
- Université Paris-Saclay (Espace Technologique, Bat. Discovery - RD 128 - 2e ét., 91190 Saint-Aubin - France)
- CNRS - Centre National de la Recherche Scientifique : UMR3680 (France)
- IRAMIS - Institut Rayonnement Matière de Saclay (91191 Gif-sur-Yvette, France - France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DRF/IRAMIS (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
- Université Paris-Saclay (Espace Technologique, Bat. Discovery - RD 128 - 2e ét., 91190 Saint-Aubin - France)
2
CIC Quinze-Vingts (CHNO 28, rue de Charenton, 75012 Paris - France)
- AP-HP - Assistance publique - Hôpitaux de Paris (AP-HP) (France)
- INSERM - Institut National de la Santé et de la Recherche Médicale : CIC1423 (101, rue de Tolbiac, 75013 Paris - France)
- Centre Hospitalier National d'Ophtalmologie des Quinze-Vingts (France)
3
TEDA School of Biological Sciences and Biotechnology (23 Hongda Street, Tianjin, 300457 - China)
- NKU - Nankai University (No.94 Weijin Road, Nankai District, Tianjin, P.R.China 300071 - China)
4
Key Laboratory of Molecular Microbiology and Technology (23 Hongda Street, Tianjin, 300457 - China)
- ministry of education (France)
5
Faculté de sciences Economiques et de Gestion (France)
- UPEC UP12 - Université Paris-Est Créteil Val-de-Marne - Paris 12 (61 avenue du Général de Gaulle - 94010 Créteil cedex - France)
6
Elettra Sincrotrone Trieste (S.C.p.A., 34149 Basovizza, Trieste, Italia - Italy)
8
UMPhy CNRS/THALES - Unité mixte de physique CNRS/Thales ( 1 avenue Augustin Fresnel, 91767 Palaiseau Cedex, France - France)
- THALES (France)
- CNRS - Centre National de la Recherche Scientifique : UMR137 (France)
9
XLIM-PHOT - Photonique Fibre et Sources Cohérentes (XLIM - 123, avenue Albert Thomas - 87060 LIMOGES CEDEX. - France)
- XLIM - XLIM : PHOT (123 Avenue Albert THOMAS 87060 LIMOGES CEDEX - France)
- UNILIM - Université de Limoges : UMR7252 (33 rue François Mitterrand BP23204 87032 Limoges - France)
- CNRS - Centre National de la Recherche Scientifique : UMR7252 (France)
10
China Information Technology Security Evaluation Center (Beijing China - China)
11
Department of Physics Department [Fayetteville] (226 Physics Building, 825 West Dickson Street, University of Arkansas, Fayetteville, AR 72701 - United States)
- University of Arkansas [Fayetteville] (1 University of Arkansas, Fayetteville, AR 72701 - United States)
12
Institute for nanosciences and engineering and physics departement (University of Arkansas Fayetteville Arkansas 72701 - United States)
- University of Arkansas [Fayetteville] (1 University of Arkansas, Fayetteville, AR 72701 - United States)
13
Department Physics (Fayetteville, Arkansas - United States)
- University of Arkansas [Fayetteville] (1 University of Arkansas, Fayetteville, AR 72701 - United States)
14
Université de Lyon (92 rue Pasteur - CS 30122, 69361 Lyon Cedex 07 - France)
15
INL - H&N - INL - Hétéroepitaxie et Nanostructures (France)
- INL - Institut des Nanotechnologies de Lyon (France)
- ECL - École Centrale de Lyon (36 avenue Guy de Collongue - 69134 Ecully cedex - France)
- Université de Lyon (92 rue Pasteur - CS 30122, 69361 Lyon Cedex 07 - France)
- UCBL - Université Claude Bernard Lyon 1 (43, boulevard du 11 novembre 1918, 69622 Villeurbanne cedex - France)
- Université de Lyon (92 rue Pasteur - CS 30122, 69361 Lyon Cedex 07 - France)
- CPE - École supérieure de Chimie Physique Electronique de Lyon (Domaine Scientifique de la Doua Bâtiment Hubert Curien 43 Boulevard du 11 Novembre 1918 69616 Villeurbanne - France)
- INSA Lyon - Institut National des Sciences Appliquées de Lyon (20 Avenue Albert Einstein,
69621 Villeurbanne cedex - France)
- Université de Lyon (92 rue Pasteur - CS 30122, 69361 Lyon Cedex 07 - France)
- INSA - Institut National des Sciences Appliquées (France)
- CNRS - Centre National de la Recherche Scientifique : UMR5270 (France)
- ECL - École Centrale de Lyon (36 avenue Guy de Collongue - 69134 Ecully cedex - France)
16
ETH Zürich - Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology in Zürich [Zürich] (Hauptgebäude,
Rämistrasse 101,
8092 Zürich - Switzerland)
Abstract : The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented.
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Journal articles
Domain :
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https://hal-cea.archives-ouvertes.fr/cea-01477631
Contributor : Dominique Girard <>
Submitted on : Monday, February 27, 2017 - 3:23:29 PM
Last modification on : Wednesday, August 19, 2020 - 11:18:14 AM
Contributor : Dominique Girard <>
Submitted on : Monday, February 27, 2017 - 3:23:29 PM
Last modification on : Wednesday, August 19, 2020 - 11:18:14 AM
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Identifiers
- HAL Id : cea-01477631, version 1
- DOI : 10.1063/1.4801968
Collections
CEA | CNRS | INSA-LYON | EC-LYON | INL | UNILIM | DSM-IRAMIS | IRAMIS-SPEC | XLIM-PHOT | XLIM | UNIV-LYON1 | CEA-DRF | INSA-GROUPE | UPEC-UPEM | UPEC | UDL
Citation
N. Barrett, J. E. Rault, L. Wang, C. Mathieu, A. Locatelli, et al.. Full field electron spectromicroscopy applied to ferroelectric materials. Journal of Applied Physics, American Institute of Physics, 2013, 113 (18), ⟨10.1063/1.4801968⟩. ⟨cea-01477631⟩
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