Full field electron spectromicroscopy applied to ferroelectric materials

N. Barrett; J. E. Rault; L. Wang; C. Mathieu; A. Locatelli; T. O. Mentes; A. Niño; S. Fusil; M. Bibes; Alain Barthélémy; D. Sando; W. Ren; S. Prosandeev; L. Bellaiche; B. Vilquin; A. Petraru; I. P. Krug; C. M. Schneider

doi:10.1063/1.4801968

Full field electron spectromicroscopy applied to ferroelectric materials

N. Barrett ¹ J. E. Rault ² L. Wang ^{3, 4} C. Mathieu ⁵ A. Locatelli ⁶ T. O. Mentes ⁶ A. Niño ⁷ S. Fusil ⁸ M. Bibes ⁸ Alain Barthélémy ⁹ D. Sando ⁸ W. Ren ¹⁰ S. Prosandeev ¹¹ L. Bellaiche ^{12, 13} B. Vilquin ^{14, 15} A. Petraru I. P. Krug C. M. Schneider ¹⁶

1 LENSIS - Laboratoire d'Etude des NanoStructures et Imagerie de Surface

SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay

2 CIC Quinze-Vingts

3 TEDA School of Biological Sciences and Biotechnology

4 Key Laboratory of Molecular Microbiology and Technology

5 Faculté de sciences Economiques et de Gestion

6 ELETTRA Sincrotrone Trieste

7 LEFS - Laboratorio de Electrofisiologia

8 UMP CNRS/THALES - Unité mixte de physique CNRS/Thalès

9 XLIM-PHOT - Photonique Fibre et Sources Cohérentes

XLIM - XLIM : PHOT

10 China Information Technology Security Evaluation Center

11 Department of Physics Department [Fayetteville]

12 Institute for nanosciences and engineering and physics departement

13 Department Physics

14 Université de Lyon

15 INL - Institut des Nanotechnologies de Lyon

16 ETH Zürich - Eidgenössische Technische Hochschule [Zürich]

Abstract : The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented.

Type de document :

Article dans une revue

Journal of Applied Physics, American Institute of Physics, 2013, 113 (18), 〈10.1063/1.4801968〉

Domaine :

Physique [physics]

Liste complète des métadonnées

https://hal-cea.archives-ouvertes.fr/cea-01477631
Contributeur : Dominique Girard <>
Soumis le : lundi 27 février 2017 - 15:23:29
Dernière modification le : vendredi 16 mars 2018 - 01:13:56

Full field electron spectromicroscopy applied to ferroelectric materials

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