Photoemission electron microscopy of Schottky contacts, Surface Science, vol.396, issue.1-3, pp.411-421, 1998. ,
DOI : 10.1016/S0039-6028(97)00696-1
Use of emission electron microscope for potential mapping in semiconductor microelectronics, Journal of Microscopy, vol.206, issue.2, pp.132-138, 2002. ,
DOI : 10.1046/j.1365-2818.2002.01012.x
Imaging of three-dimensional objects in emission electron microscopy, Journal of Microscopy, vol.202, issue.3, pp.480-487, 2001. ,
DOI : 10.1046/j.1365-2818.2001.00846.x
Caustic imaging of gallium droplets using mirror electron microscopy, Ultramicroscopy, vol.111, issue.5, pp.356-363, 2011. ,
DOI : 10.1016/j.ultramic.2011.01.019
Role of photocurrent in low-temperature photoemission studies of Schottky-barrier formation, Physical Review B, vol.41, issue.11, pp.7918-7922, 1990. ,
DOI : 10.1103/PhysRevB.41.6092
Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns, Surface Science, vol.604, issue.19-20, pp.1628-1636, 2010. ,
DOI : 10.1016/j.susc.2010.06.006
Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns, Journal of Physics: Condensed Matter, vol.21, issue.31, p.314015, 2009. ,
DOI : 10.1088/0953-8984/21/31/314015
URL : https://hal.archives-ouvertes.fr/hal-00685871