Microscopic work function anisotropy and surface chemistry of 316L stainless steel using photoelectron emission microscopy
Abstract
We have studied the variation in the work function of the surface of sputtered cleaned 316L stainless steel with only a very thin residual oxide surface layer as a function of grain orientation using X-ray photo-electron emission microscopy (XPEEM) and Electron Backscattering Diffraction. The grains are mainly oriented [1 1 1] and [1 0 1]. Four distinct work function values spanning a 150 meV energy window are measured. Grains oriented [1 1 1] have a higher work function than those oriented [1 0 1]. From core level XPEEM we deduce that all grain surfaces are Cr enriched and Ni depleted whereas the Cr/Fe ratio is similar for all grains. The [1 1 1] oriented grains show evidence for a Cr 2 O 3 surface oxide and a higher concentration of defective oxygen sites.
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