Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes, Applied Physics Letters, vol.69, issue.13, p.1975, 1996. ,
DOI : 10.1063/1.117179
Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter, Review of Scientific Instruments, vol.79, issue.7, p.73701, 2008. ,
DOI : 10.1063/1.2952058
Chr etien, and F. Houz e, WO patent application 2011138738A1 (2011); EP patent application 2567245A1, 2013. ,
Electrical properties of short DNA oligomers characterized by conducting atomic force microscopy, Physical Chemistry Chemical Physics, vol.6, issue.18, p.4459, 2004. ,
DOI : 10.1039/b410862k
The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation, Measurement Science and Technology, vol.8, issue.11, p.1333, 1997. ,
DOI : 10.1088/0957-0233/8/11/020
Pulsed force mode: a new method for the investigation of surface properties, Surface and Interface Analysis, vol.39, issue.5-6, p.336, 1999. ,
DOI : 10.1002/(SICI)1096-9918(199905/06)27:5/6<336::AID-SIA512>3.0.CO;2-0
Electron Transfer through Organic Molecules, The Journal of Physical Chemistry B, vol.103, issue.38, p.8122, 1999. ,
DOI : 10.1021/jp9921699
Distance Dependence of Electron Tunneling through Self-Assembled Monolayers Measured by Conducting Probe Atomic Force Microscopy:?? Unsaturated versus Saturated Molecular Junctions, The Journal of Physical Chemistry B, vol.106, issue.11, p.2813, 2002. ,
DOI : 10.1021/jp013476t
Length-Dependent Transport in Molecular Junctions Based on SAMs of Alkanethiols and Alkanedithiols:?? Effect of Metal Work Function and Applied Bias on Tunneling Efficiency and Contact Resistance, Journal of the American Chemical Society, vol.126, issue.43, p.14287, 2004. ,
DOI : 10.1021/ja046274u
The Kinetics of Electron Transfer Through Ferrocene-Terminated Alkanethiol Monolayers on Gold, The Journal of Physical Chemistry, vol.99, issue.35, p.13141, 1995. ,
DOI : 10.1021/j100035a016
Mechanism of electron conduction in self-assembled alkanethiol monolayer devices, Physical Review B, vol.68, issue.3, p.35416, 2003. ,
DOI : 10.1103/PhysRevB.68.035416
New SPM techniques for analyzing OPV materials, Materials Today, vol.13, issue.9, p.50, 2010. ,
DOI : 10.1016/S1369-7021(10)70165-6
Nanoscale Charge Transport and Internal Structure of Bulk Heterojunction Conjugated Polymer/Fullerene Solar Cells by Scanning Probe Microscopy, The Journal of Physical Chemistry C, vol.112, issue.18, p.7241, 2008. ,
DOI : 10.1021/jp712086q
Self-Aligned, Gated Arrays of Individual Nanotube and Nanowire Emitters, Nano Letters, vol.4, issue.9, p.1575, 2004. ,
DOI : 10.1021/nl049401t