L. Gross, F. Mohn, N. Moll, P. Liljeroth, and G. Meyer, The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy, Science, vol.325, issue.5944, 2009.
DOI : 10.1126/science.1176210

J. Polesel-maris, C. Lubin, F. Thoyer, and J. Cousty, Combined dynamic scanning tunneling microscopy and frequency modulation atomic force microscopy investigations on polythiophene chains on graphite with a tuning fork sensor, Journal of Applied Physics, vol.109, issue.7, 2011.
DOI : 10.1063/1.3556437

E. N. Voloshina, Y. S. Dedkov, S. Torbrügge, A. Thissen, and M. Fonin, Graphene on Rh(111): Scanning tunneling and atomic force microscopies studies, Applied Physics Letters, vol.100, issue.24, 2012.
DOI : 10.1063/1.4729549

L. P. Van, V. Kyrylyuk, J. Polesel-maris, F. Thoyer, C. Lubin et al., Experimental Three-Dimensional Description of the Liquid Hexadecane/Graphite Interface, Langmuir, vol.25, issue.2, 2009.
DOI : 10.1021/la803665k

J. Polesel-maris, J. Legrand, T. Berthelot, A. Garcia, P. Viel et al., Force spectroscopy by dynamic atomic force microscopy on bovine serum albumin proteins changing the tip hydrophobicity, with piezoelectric tuning fork selfsensing scanning probe, Sensors Actuators B Chem, vol.161, issue.775, 2012.
URL : https://hal.archives-ouvertes.fr/cea-00960500

R. Gomer, Field Emission and Field Ionization, 1961.

A. J. Melmed, The art and science and other aspects of making sharp tips, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol.9, issue.2, 1991.
DOI : 10.1116/1.585467

M. Klein and G. Schwitzgebel, An improved lamellae drop-off technique for sharp tip preparation in scanning tunneling microscopy, Review of Scientific Instruments, vol.68, issue.8, 1997.
DOI : 10.1063/1.1148249

M. Kulawik, M. Nowicki, G. Thielsch, L. Cramer, H. Rust et al., A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors, Review of Scientific Instruments, vol.74, issue.2, 2003.
DOI : 10.1063/1.1532833

H. Morikawa and K. Goto, Reproducible sharp???pointed tip preparation for field ion microscopy by controlled ac polishing, Review of Scientific Instruments, vol.59, issue.10, 1988.
DOI : 10.1063/1.1139985

J. P. Ibe, P. P. Bey-jr, S. L. Brandow, R. A. Brizzolara, N. A. Burnham et al., On the electrochemical etching of tips for scanning tunneling microscopy, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol.8, issue.4
DOI : 10.1116/1.576509

Y. Nakamura, Y. Mera, and K. Maeda, A reproducible method to fabricate atomically sharp tips for scanning tunneling microscopy, Review of Scientific Instruments, vol.70, issue.8, 1999.
DOI : 10.1063/1.1149921

M. Fotino, Tip sharpening by normal and reverse electrochemical etching, Review of Scientific Instruments, vol.64, issue.1, 1993.
DOI : 10.1063/1.1144419

B. Ju, Y. Chen, M. Fu, Y. Chen, and Y. Yang, Systematic study of electropolishing technique for improving the quality and production reproducibility of tungsten STM probe, Sensors Actuators A Phys, 2009.

L. Libioulle, Y. Houbion, and J. Gilles, Very sharp gold and platinum tips to modify gold surfaces in scanning tunneling microscopy, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol.13, issue.3, 1995.
DOI : 10.1116/1.587847

L. Libiouille, Y. Houbion, and J. Gilles, Very sharp platinum tips for scanning tunneling microscopy, Review of Scientific Instruments, vol.66, issue.1, 1995.
DOI : 10.1063/1.1146153

J. Lindahl, T. Takanen, and L. Montelius, Easy and reproducible method for making sharp tips of Pt/Ir, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol.16, issue.6, 1998.
DOI : 10.1116/1.590445

I. Ekvall, E. Wahlstr?-om, D. Claesson, H. Olin, and E. Olsson, Preparation and characterization of electrochemically etched W tips for STM, Measurement Science and Technology, vol.10, issue.1, pp.957-0233006, 1999.
DOI : 10.1088/0957-0233/10/1/006

A. Schirmeisen, Metallic Adhesion and Tunneling at the Atomic Scale, Doctoral dissertation, 1999.

A. Lucier, Preparation and Characterization of Tungsten Tips Suitable for Molecular Electronics Studies, Master dissertation, 2004.

A. Lucier, H. Mortensen, Y. Sun, and P. Grütter, Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy, Physical Review B, vol.72, issue.23, 2005.
DOI : 10.1103/PhysRevB.72.235420

Z. Q. Yu, C. M. Wang, Y. Du, S. Thevuthasan, and I. Lyubinetsky, Reproducible tip fabrication and cleaning for UHV STM, Ultramicroscopy, vol.108, issue.9, 2008.
DOI : 10.1016/j.ultramic.2008.02.010

T. Hagedorn, Atomic Contacts Characterized by Force and Current, Doctoral dissertation, 2010.

T. Hagedorn, M. Ouali, W. Paul, D. Oliver, Y. Miyahara et al., Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope, Review of Scientific Instruments, vol.82, issue.11, 2011.
DOI : 10.1063/1.3660279

M. Setvín, J. Javorský, D. Tur-cinkov-a, I. Matolínov-a, P. Sobotík et al., Ultrasharp tungsten tips-characterization and nondestructive cleaning Information extraction from FN plots of tungsten microemitters, Ultramicroscopy Ultramicroscopy, vol.113, issue.48, 2012.

A. H. Sørensen, U. Hvid, M. W. Mortensen, and K. A. Mørch, Preparation of platinumiridium scanning probe microscopy tips, Rev. Sci. Instrum, vol.70, issue.3059, 1999.

J. Llopis and A. Sancho, Electrochemical Corrosion of Platinum in Hydrochloric Acid Solutions, Journal of The Electrochemical Society, vol.108, issue.8, 1961.
DOI : 10.1149/1.2428205

I. Borzenets, I. Yoon, M. M. Prior, B. R. Donald, R. D. Mooney et al., Ultra-sharp metal and nanotube-based probes for applications in scanning microscopy and neural recording, Journal of Applied Physics, vol.111, issue.7, 2012.
DOI : 10.1063/1.3702802

M. Fotino, Nanotips by reverse electrochemical etching, Applied Physics Letters, vol.60, issue.23, 1992.
DOI : 10.1063/1.107468

C. A. Spindt, I. Brodie, L. Humphrey, and E. R. Westerberg, Physical properties of thinfilm field emission cathodes with molybdenum cones, J. Appl. Phys, vol.47, issue.5248, 1976.

M. S. Wang, J. Y. Wang, and L. Peng, Engineering the cap structure of individual carbon nanotubes and corresponding electron field emission characteristics, Applied Physics Letters, vol.88, issue.24, 2006.
DOI : 10.1063/1.2208941

J. Chen, Introduction to Scanning Tunneling Microscopy, 1993.

W. P. Dyke and W. W. Dolan, Field emission, Adv. Electron. Electron Phys, pp.65-253961226, 1956.

I. Horcas, R. Fern-andez, J. M. Omez-rodríguez, J. Colchero, J. Herrero et al., : A software for scanning probe microscopy and a tool for nanotechnology, Review of Scientific Instruments, vol.78, issue.1, 2007.
DOI : 10.1063/1.2432410

D. Ne-cas and P. Klapetek, Gwyddion: an open-source software for SPM data analysis, Cent. Eur, J. Phys, vol.10, issue.181, pp.11534-11545, 2011.

J. Penuelas, A. Ouerghi, D. Lucot, C. David, and J. Gierak, Surface morphology and characterization of thin graphene films on SiC vicinal substrate, Physical Review B, vol.79, issue.3, 2009.
DOI : 10.1103/PhysRevB.79.033408

C. Dong, M. C. Gupta, and G. R. Myneni, Influences of Surface Adsorption on Field Emission Perfomances for W, Pt/Ir and Multi-wall Carbon Nanotube Emitters, 2002.

F. Varchon, P. Mallet, J. Veuillen, and L. Magaud, Ripples in epitaxial graphene on the Si-terminated SiC(0001) surface, Physical Review B, vol.77, issue.23, 2008.
DOI : 10.1103/PhysRevB.77.235412
URL : https://hal.archives-ouvertes.fr/hal-00726728

U. Starke and C. , Epitaxial graphene on SiC (0001) and SiC (000e1): from surface reconstructions to carbon electronics, J. Phys. Condens. Matter, vol.21122113, issue.134016, pp.953-8984, 2009.

A. Ouerghi, M. G. Silly, M. Marangolo, C. Mathieu, M. Eddrief et al., Large-Area and High-Quality Epitaxial Graphene on Off-Axis SiC Wafers, ACS Nano, vol.6, issue.7, 2012.
DOI : 10.1021/nn301152p
URL : https://hal.archives-ouvertes.fr/hal-01240933

T. Filleter and R. Bennewitz, Structural and frictional properties of graphene films on SiC(0001) studied by atomic force microscopy, Physical Review B, vol.81, issue.15, 2010.
DOI : 10.1103/PhysRevB.81.155412

J. A. Mor-an-meza, C. Lubin, F. Thoyer, and J. Cousty, Tip induced mechanical deformation of epitaxial graphene grown on reconstructed 6H-SiC(0001) surface during scanning tunneling and atomic force microscopy studies, Nanotechnology, vol.2626, issue.25, pp.957-4484, 2015.