M. L. André, Status of the LMJ project, Proc. SPIE, pp.38-42, 1996.

B. M. Van-wonterghem, S. C. Burkhart, C. A. Haynam, K. R. Manes, C. D. Marshall et al., National Ignition Facility commissioning and performance, Optical Engineering at the Lawrence Livermore National Laboratory II: The National Ignition Facility, pp.55-65, 2004.
DOI : 10.1117/12.538464

D. Nicola and J. P. Leidinger, The Ligne d'Integration Laser (LIL): construction status and first 1-w light early results, Proc. SPIE, pp.418-424, 2003.

H. Bercegol, A. Boscheron, J. Di-nicola, E. Journot, L. Lamaignère et al., Laser damage phenomena relevant to the design and operation of an ICF laser driver, Journal of Physics: Conference Series, vol.112, issue.3, p.32013, 2008.
DOI : 10.1088/1742-6596/112/3/032013

R. Chow, R. Bickel, and J. Ertel, Cleanliness validation of NIF small optics, Optical System Contamination: Effects, Measurements, and Control VII, pp.19-24, 2002.
DOI : 10.1117/12.481661

R. R. Kunz and V. Libermann, Experimentation and modeling of organic photocontamination on lithographic optics, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol.18, issue.3, pp.1306-1313, 2000.
DOI : 10.1116/1.591379

A. E. Duisterwinkel and A. T. Bastein, Feasibility of UV cleaning of 157-nm reticles, Microelectronic Engineering, vol.67, issue.68, pp.67-68, 2003.
DOI : 10.1016/S0167-9317(03)00166-7

F. E. Hovis, B. A. Shepherd, C. T. Radcliffe, and H. A. Maliborski, Contamination damage in pulsed 1-??m lasers, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, pp.707-716, 1996.
DOI : 10.1117/12.240348

C. Scurlock, A phenomenological study of contamination enhanced laser induced damage in sealed lasers, Proc. SPIE, pp.86-91, 2004.

C. Y. Sheng, Effect of laser-induced damage on optical windows in the presence of adhesives under simulated thermal-vacuum conditions, Proc. SPIE, pp.1-12, 2007.

L. Bruel, Environmental effects on optical component aging, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, pp.158-169, 2003.
DOI : 10.1117/12.472055

I. Tovena-pecault, K. Bien-aime, and A. Pereira, Organic molecular contamination in prototype of the future Laser MegaJoule, pp.16-18

D. M. Price, Vapor pressure determination by thermogravimetry, Thermochimica Acta, vol.367, issue.368, pp.253-262, 2001.
DOI : 10.1016/S0040-6031(00)00676-6

A. Pereira, J. Coutard, S. Becker, I. Tovena, P. Bouchut et al., Impact of organic contamination on 1064-nm laser-induced damage threshold of dielectric mirrors, Laser-Induced Damage in Optical Materials: 2006, pp.6403-6403, 2006.
DOI : 10.1117/12.696037

P. West and N. Starostina, AFM image artefacts

L. Lamaignère, S. Bouillet, R. Courchinoux, T. Donval, M. Josse et al., An accurate, repeatable, and well characterized measurement of laser damage density of optical materials, Review of Scientific Instruments, vol.78, issue.10, p.103105, 2007.
DOI : 10.1063/1.2796148

J. Wong, J. L. Ferriera, E. F. Lindsey, D. L. Haupt, D. Hutcheon et al., Morphology and microstructure in fused silica induced by high fluence ultraviolet 3?? (355nm) laser pulses, Journal of Non-Crystalline Solids, vol.352, issue.3, pp.255-272, 2006.
DOI : 10.1016/j.jnoncrysol.2005.11.036

K. Awazu, Ablation and compaction of amorphous SiO2 irradiated with ArF excimer laser, Journal of Non-Crystalline Solids, vol.337, issue.3, pp.241-253, 2004.
DOI : 10.1016/j.jnoncrysol.2004.04.008

N. Kuzuu, K. Yoshida, H. Yoshida, T. Kamimura, and N. Kamisugi, Laser-induced bulk damage in various types of vitreous silica at 1064, 532, 355, and 266 nm: evidence of different damage mechanisms between 266-nm and longer wavelengths, Applied Optics, vol.38, issue.12, pp.2510-2515, 1999.
DOI : 10.1364/AO.38.002510

B. C. Stuart, M. D. Feit, and A. M. Rubenchik, Laser-Induced Damage in Dielectrics with Nanosecond to Subpicosecond Pulses, Physical Review Letters, vol.74, issue.12, p.2248, 1995.
DOI : 10.1103/PhysRevLett.74.2248

H. G. Floch, P. F. Belleville, P. M. Pegon, C. S. Dijonneau, and J. R. Guerain, Sol gel optical thin films for an advanced megajoule-class Nd:glass-laser ICF driver, Proc. SPIE 2714, pp.521-536, 1996.