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Conference papers
Investigation of Near-Field Pulsed EMI at IC Level
Abstract : This article describes the use of a near-field electromagnetic pulse EMP injection technique in order to perform a hardware cryptanalysis of the AES algorithm. This characterization technique is based on the fact that conductors, such as the rails of a Power Distribution Network PDN which is one of the primary EMI risk factors, act as antennas for the radiated EMP energy. This energy induces high electrical currents in the PDN responsible for the violation of the integrated circuit's timing constraints. This modification of the chip's behavior is then exploited in order to recover the AES key by using cryptanalysis techniques based on Differential Fault Analysis (DFA).
Cited literature [7 references]
https://hal-cea.archives-ouvertes.fr/cea-01097120
Contributor : Bruno Robisson Connect in order to contact the contributor
Submitted on : Thursday, December 18, 2014 - 9:55:26 PM
Last modification on : Tuesday, December 8, 2020 - 9:50:41 AM
Long-term archiving on: : Monday, March 23, 2015 - 5:30:12 PM
Contributor : Bruno Robisson Connect in order to contact the contributor
Submitted on : Thursday, December 18, 2014 - 9:55:26 PM
Last modification on : Tuesday, December 8, 2020 - 9:50:41 AM
Long-term archiving on: : Monday, March 23, 2015 - 5:30:12 PM
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