Investigation of nanoelectrodes by Transmission Electron Microscopy - Archive ouverte HAL Access content directly
Journal Articles MRS Proceedings Year : 2001

Investigation of nanoelectrodes by Transmission Electron Microscopy

Abstract

Electrodes for making connections to single molecules and clusters must have separations smaller than 10 nm. They are therefore difficult or impossible to image with atomic force microscopes (AFM) or Scanning Electron Microscopes (SEM). We have fabricated nanoelelectrodes by different methods to contacts nanoclusters and conjugated molecules and investigated their properties in transmission electron microscope (TEM) and their electrical characteristics at room temperature and at 4.2K. The electrodes are made on SiN4 membranes, which is transparent to high energy electrons and which make it possible to image features of a few nanometers in TEM.
Fichier principal
Vignette du fichier
Kabir.pdf (1 Mo) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

cea-01056964 , version 1 (21-08-2014)

Identifiers

Cite

M.S. Kabir, S.H.M. Persson, Yimin Yao, Jean-Philippe Bourgoin, Serge Palacin. Investigation of nanoelectrodes by Transmission Electron Microscopy. MRS Proceedings, 2001, 676, pp.Y6.9. ⟨10.1557/PROC-676-Y6.9⟩. ⟨cea-01056964⟩

Collections

CEA PUBNIMBE
35 View
186 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More