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Journal articles
Polishing-induced contamination of fused silica optics and laser induced damage density at 351 nm
Abstract : In this paper we study the effect of contamination induced by fabrication process on laser damage density of fused silica polished parts at 351 nm in nanosecond regime. We show, owing to recent developments of our raster scan metrology, that a good correlation exists between damage
Cited literature [18 references]
https://hal-cea.archives-ouvertes.fr/cea-01053354
Contributor : Jerome Neauport <>
Submitted on : Wednesday, July 30, 2014 - 2:33:13 PM
Last modification on : Tuesday, October 6, 2020 - 4:30:48 PM
Long-term archiving on: : Tuesday, November 25, 2014 - 9:06:06 PM
Contributor : Jerome Neauport <>
Submitted on : Wednesday, July 30, 2014 - 2:33:13 PM
Last modification on : Tuesday, October 6, 2020 - 4:30:48 PM
Long-term archiving on: : Tuesday, November 25, 2014 - 9:06:06 PM
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oe-13-25-10163.pdf
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