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Journal articles
Using STED and ELSM confocal microscopy for a better knowledge of fused silica polished glass interface
Abstract : Characteristics and nature of close surface defects existing in fused silica polished optical surfaces were explored. Samples were deliberately scratched using a modified polishing process in presence of different fluorescent dyes. Various techniques including Epi-fluorescence Laser Scanning Mode (ELSM) or STimulated Emission Depletion (STED) confocal microscopy were used to measure and quantify scratches that are sometimes embedded under the polished layer. We show using a non-destructive technique that depth of the modified region extends far below the surface. Moreover cracks of 120 nm width can be present ten micrometers below the surface.
Cited literature [9 references]
https://hal-cea.archives-ouvertes.fr/cea-01053348
Contributor : Jerome Neauport Connect in order to contact the contributor
Submitted on : Wednesday, July 30, 2014 - 2:51:48 PM
Last modification on : Wednesday, October 14, 2020 - 4:19:20 AM
Long-term archiving on: : Tuesday, November 25, 2014 - 9:05:33 PM
Contributor : Jerome Neauport Connect in order to contact the contributor
Submitted on : Wednesday, July 30, 2014 - 2:51:48 PM
Last modification on : Wednesday, October 14, 2020 - 4:19:20 AM
Long-term archiving on: : Tuesday, November 25, 2014 - 9:05:33 PM
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oe-21-24-29769.pdf
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