Dislocation mobility study of heavy ion induced track damage in LiF crystals

I. Manika (1) , J. Maniks (1) , Marcel Toulemonde (2) , K. Schwartz (3)

1 ISSP
2 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
3 GSI - Helmholtz zentrum für Schwerionenforschung GmbH

The track damage created in LiF crystals by swift U, Xe and Kr ions with a specific energy of 11.1 MeV/u was studied using dislocation mobility measurements, track etching, SEM, AFM and optical microscopy. The results demonstrate high sensitivity of dislocation mobility to track core damage. The relationship between the energy loss of ions, dislocation mobility and track structure is discussed.

Keywords: Ion tracks; Track etching; Dislocation mobility; LiF

Domains: Materials Science [cond-mat.mtrl-sci]

I. Manika, J. Maniks, Marcel Toulemonde, K. Schwartz. Dislocation mobility study of heavy ion induced track damage in LiF crystals. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2009, 267, pp.949-952. ⟨cea-00376129⟩