AODO: Secondary ion emission and surface modification

S. Akcöltekin (1) , Ibrahim Alzaher (2) , Brigitte Ban d'Etat (2) , Thierry Been (2) , Philippe Boduch (2) , Amine Cassimi (2) , Hussein Hijazi (2) , Henning Lebius (2) , Bruno Manil (2) , Jean-Marc Ramillon (2) , Hermann Rothard (2) , M. Schleberger (1) , E.F. da Silveira (3)

1 FB Physik
2 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
3 PUC - Pontifícia Universidade Católica, Departamento de Física

In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe14+ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL).

Keywords: Sputtering; Highly charged ions; Surface structure; LEED

Domains: Physics [physics]; Condensed Matter [cond-mat]; Materials Science [cond-mat.mtrl-sci]

S. Akcöltekin, Ibrahim Alzaher, Brigitte Ban d'Etat, Thierry Been, Philippe Boduch, et al.. AODO: Secondary ion emission and surface modification. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2009, 267, pp.649-651. ⟨cea-00374510⟩