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A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements

T. Schneider 1 D. Leduc 1 C. Lupi 1 Julien Cardin 2 H. Gundel 1 C. Boisrobert 1
1 IREENA - Institut de Recherche en Electrotechnique et Electronique de Nantes Atlantique EA4642
2 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
Abstract : We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers.
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Journal articles
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https://hal-cea.archives-ouvertes.fr/cea-00275198
Contributor : Chantal Brassy <>
Submitted on : Tuesday, April 22, 2008 - 4:57:13 PM
Last modification on : Friday, December 6, 2019 - 9:14:09 AM

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  • HAL Id : cea-00275198, version 1

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CNRS | UNIV-NANTES | CEA | DSM-IRAMIS | COMUE-NORMANDIE | IRAMIS-CIMAP | CEA-DRF | ENSICAEN | UNICAEN

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T. Schneider, D. Leduc, C. Lupi, Julien Cardin, H. Gundel, et al.. A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements. Journal of Applied Physics, American Institute of Physics, 2008, 103, pp.063110. ⟨cea-00275198⟩

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