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Article Dans Une Revue Applied optics Année : 2008

Determination of refractive index, thickness, and the optical losses of thin films from prism–film coupling measurements

Résumé

We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
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Dates et versions

cea-00275172 , version 1 (22-04-2008)

Identifiants

  • HAL Id : cea-00275172 , version 1

Citer

Julien Cardin, Dominique Leduc. Determination of refractive index, thickness, and the optical losses of thin films from prism–film coupling measurements. Applied optics, 2008, 47 (7), pp.894-900. ⟨cea-00275172⟩
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