Crack-Free Silicon-Nitride-on-Insulator Nonlinear Circuits for Continuum Generation in the ${C}$ -Band
Résumé
We report on the fabrication and testing of silicon-nitride-on-insulator (SiNOI) nonlinear photonic circuits for complementary metal oxide semiconductor compatible monolithic co-integration with silicon-based optoelectronics. In particular, a process has been developed to fabricate low-loss crack-free Si3N4 730-nm-thick films for Kerr-based nonlinear functions featuring full process compatibility with existing silicon photonics and front-end Si optoelectronics. Experimental evidence shows that 2.1-cm-long nanowires based on such crack-free silicon nitride films are capable of generating a frequency continuum spanning 1515-1575 nm via self-phase modulation. This work paves the way to time-stable power-efficient Kerr-based broadband sources featuring full process compatibility with Si photonic integrated circuits (Si-PICs) on CMOS-lines. Index Terms-Complementary metal-oxide-semiconductor (CMOS), photonic integrated circuits (PICs), frequency continuum, nonlinear optics, silicon-nitride-on-insulator (SiNOI).
Fichier principal
Crack-Free SiNOI Nonlinear Circuits for Continuum Generation in the C-band V_3_Jan_HE_R3_post-print.pdf (1008.44 Ko)
Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...